Get Advanced Test Methods for SRAMs: Effective Solutions for PDF
By Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel
Modern electronics rely on nanoscaled applied sciences that current new demanding situations when it comes to trying out and diagnostics. thoughts are really susceptible to defects given that they take advantage of the expertise limits to get the top density. This e-book is a useful advisor to the checking out and diagnostics of the most recent iteration of SRAM, the most commonly utilized varieties of reminiscence. Classical tools for trying out reminiscence are designed to address the so-called "static faults," yet those try recommendations will not be adequate for faults which are rising within the newest Very Deep Sub-Micron (VDSM) applied sciences. those new fault versions, often called "dynamic faults", will not be lined by means of classical attempt ideas and require the committed try sequences awarded during this book.
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Extra info for Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel